TMI Hosts Texas Institute for the Deaf
On April 13, 2026, TMI’s Associate Director, Dr. Raluca Gearba, hosted high school students from the Texas School for the Deaf for an engaging, hands-on activity using the Scios FIB/SEM microscope. During the session, students were introduced to advanced electron microscopy imaging techniques and explored a variety of samples, including nanoparticles, battery cathode materials, electronic devices, pollen, and human hair. They were guided through the operation of the microscope and had the opportunity to collect electron microscopy images themselves, providing the students with a firsthand experience with cutting-edge instrumentation.
The demonstration offered a unique look at how scientists visualize structures at the micro- and nanoscale, sparking curiosity and interest in materials science and engineering. The outreach event also included a tour of the Electron Microscopy Facility at TMI.
The event was organized in collaboration with the Center for Dynamics and Control of Materials: An NSF MRSEC, UT Austin.